September 2017

Conference Paper

Atomic Defects and Edge Structure in Single-layer Ti3C2Tx MXene

By:
Sang, Xiahan ; Yilmaz, Dundar; Xie, Yu; Alhabeb, M.; Anasori, Babak; Li, Xufan; Xiao, Kai ; Kent, Paul R; Duin, Adri; Gogotsi, Yury; Unocic, Raymond R
Journal Name:
Microscopy and Microanalysis
Page Number:
1704-1705
Volume:
23
Issue Number:
S1
Publication Date:
September 7, 2017
Conference Name:
Microscopy and microanalysis
Conference Location:
St. Louis, Tennessee, United States of America
Conference Sponsor:
MSA
View DOI Listing:
https://doi.org/10.1017/S1431927617009187

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