Omicron AFM

Ultra-high Vacuum Scanning Force Microscopy

The Scienta Omicron VT SPM is the most reliable SPM for room- and variable temperature applications. The classic Beam Deflection AFM for contact and non-contact AFM offers the flexibility for many operational modes and different cantilever types. For example, high resolution AFM, Friction Force Microscopy, Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (SKPM) and Magnetic Force Microscopy (MFM) are available.

Features

Available modes:

• Band excitation piezoresponse force microscopy
• Kelvin probe force microscopy
• Magnetic force microscopy 
• Electrostatic force microscopy

Specifications/Extras

• Temperature: 77K – 500K, pressure: 10E-10 Torr (UHV) 
• Nanonis controller 
• Preparation chamber: plasma and sputter clean, anneal 
• Residual gas analyzer 

Equipment

 Scienta Omicron VT SPM with Nanonis Electronics

References

Dziaugys, A., Kelley, K., Brehm, J.A. et al. Piezoelectric domain walls in van der Waals antiferroelectric CuInP₂Se₆. Nat Commun 11, 3623 (2020). https://doi.org/10.1038/s41467-020-17137-0

Contacts