August 2022

Conference Paper

A Bayesian approach to nanoparticle characterization

By:
Lukens, Joseph M; Passian, Ali
Book Title:
CLEO 2022
Publication Date:
August 26, 2022
Publisher Location:
Optica Publishing Group, District of Columbia, United States of America
Conference Name:
CLEO: QELS_Fundamental Science 2022
Conference Location:
San Jose, California, United States of America
Conference Sponsor:
Optica
View DOI Listing:
https://doi.org/10.1364/CLEO_QELS.2022.FTh2B.6

Abstract

We introduce and numerically validate a Bayesian method for plasmonic nanometrology. Applicable to any system described by a scattering cross section, our approach quantifies uncertainty automatically and enables model comparison through Bayes factors.


Related Researchers