October 2005

Journal

A New Understanding of Near-Threshold Damage for 200 keV Irradiation In Silicon

By:
Stoddard, Nathan; Duscher, Gerd J; Windl, Wolfgang; Rozgonyi, G.
Journal Name:
Journal of Materials Science
Page Number:
3639-3650
Volume:
40
Issue Number:
14
Publication Date:
October 12, 2005