May 2013

Conference Paper

Active-Mask Coded-Aperture Imaging

By:
Cunningham, Mark; Blakeman, Edward D; Fabris, Lorenzo ; Habte Ghebretatios, Frezghi ; Ziock, Klaus-Peter
Publication Date:
May 8, 2013
Conference Name:
IEEE
Conference Location:
Honolulu, Hawaii, United States of America
Conference Sponsor:
IEEE