July 2018

Conference Paper

Atomic Force Microscopy Beyond the Standard Quantum Limit

By:
Lawrie, Benjamin J; Pooser, Raphael C
Book Title:
Symposium on Emerging Quantum Sensing Techniques and Applications I (JF2B)
Publication Date:
July 18, 2018
Conference Name:
CLEO: QELS_Fundamental Science 2018
Conference Location:
San Jose, California, United States of America
Conference Sponsor:
Optical Society of America
View DOI Listing:
https://doi.org/10.1364/CLEO_AT.2018.JF2B.3

Abstract

We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.


Related Researchers