November 2023

Conference Paper

Automatic detection of crystallographic defects in STEM images by unsupervised learning with translational invariance

By:
Guo, Yueming ; Lupini, Andrew R; Cai, Hui ; Xiao, Kai ; Krylyuk, Sergiy; Davydov, Albert; Guo, Qianying ; Kalinin, Sergei V
Journal Name:
Microscopy and Microanalysis
Page Number:
1460-1462
Volume:
27
Issue Number:
S1
Publication Date:
November 9, 2023
Conference Name:
Microscopy and Microanalysis
Conference Location:
Pittsburgh, Pennsylvania, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1017/S1431927621005407

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