February 2009

Conference Paper

Beam-induced Changes of FePt Nanoparticles during STEM In-situ Annealing

By:
Wittig, J.; Bentley, James ; Allard Jr, Lawrence F; Wellons, M.S.; Lukehart, C.M.
Page Number:
348-349
Volume:
14(Su2)
Book Title:
Proceedings Microscopy and Microanalysis 2008
Publication Date:
February 23, 2009
Publisher Location:
Cambridge University Press, Cambridge, United Kingdom
Conference Name:
Microscopy and Microanalysis 2008
Conference Location:
Albuquerque, New Mexico, United States of America
Conference Sponsor:
Microscopy Soc Amer, Microbeam Analysis Soc, Intern Metallographic Soc, Intern Soc Analytic Cytology

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