November 2023

Conference Paper

Causal Analysis of Parameterized Atomic HAADF-STEM Across a Doped Ferroelectric Phase Boundary

By:
Nelson, Christopher T; Ziatdinov, Maxim A; Zhang, Xiaohang; Vasudevan, Rama K; Eliseev, Eugene; Morozovska, Anna; Takeuchi, Ichiro; Kalinin, Sergei V
Journal Name:
Microscopy and Microanalysis
Page Number:
2762-2764
Volume:
27
Issue Number:
S1
Publication Date:
November 9, 2023
Conference Name:
Microscopy and Microanalysis 2021
Conference Location:
Pittsburgh, Pennsylvania, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1017/S1431927621009703