September 2005

Conference Paper

Characterization of Stress Relaxation, Dislocations and Crystallographic Tilt Via X-ray Microdiffraction in GaN (0001) Layers Grown by Maskless Pendeo-Epitaxy

By:
Barabash, Rozaliya I; Ice, Gene E; Liu, Wenjun ; Einfeldt, S.; Hommel, D.; Roskowski, A.; Davis, R.
Page Number:
115-120
Volume:
875
Book Title:
Thin Films-Stresses and Mechanical Properties XI
Publication Date:
September 27, 2005
Conference Name:
MRS 2005 Spring Proceedings
Conference Location:
San Francisco, California, United States of America