November 2023

Conference Paper

Characterizing the Stability of NISQ Devices

By:
Dasgupta, Samudra; Humble, Travis S
Page Number:
419-429
Issue Number:
1
Book Title:
2020 IEEE International Conference on Quantum Computing and Engineering (QCE)
Publication Date:
November 9, 2023
Conference Name:
2020 IEEE International Conference on Quantum Computing and Engineering (QCE)
Conference Location:
None, Nebraska, United States of America
Conference Sponsor:
IEEE
View DOI Listing:
https://doi.org/10.1109/QCE49297.2020.00059

Abstract

In this study, we focus on the question of stability of NISQ devices. The parameters that define the device stability profile are motivated by the work of DiVincenzo in [9] where the requirements for physical implementation of quantum computing are discussed. We develop the metrics and theoretical framework to quantify the DiVincenzo requirements and study the stability of those key metrics. The basis of our assessment is histogram similarity (in time and space). For identical experiments, devices which produce reproducible histograms in time, and similar histograms in space, are considered more reliable. To investigate such reliability concerns robustly, we propose a moment-based distance (MBD) metric. We illustrate our methodology using data collected from IBM's Yorktown device. Two types of assessments are discussed: spatial stability and temporal stability.


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