August 2012

Journal

Column-by-column compositional mapping by Z-contrast imaging

By:
Molina, S. I.; Sales Lerida, David ; Galindo, Pedro; Fuster, David; Gonzalez, Yolanda; Alen, B.; Gonzalez, Luisa; Varela Del Arco, Maria ; Pennycook, Stephen J
Journal Name:
Ultramicroscopy
Page Number:
172-173
Volume:
109
Issue Number:
N/A
Publication Date:
August 22, 2012

Abstract

A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAsxP1!x alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(0 01) substrates.