May 2010

Journal

Comparison Measurements of Silicon Carbide Temperature Monitors

By:
Rempe, Joy; Knudson, Darrell; Condie, Keith; Snead, Lance L
Journal Name:
IEEE Transactions on Nuclear Science
Page Number:
1-6
Volume:
TNS-0004
Issue Number:
3
Publication Date:
May 4, 2010
View DOI Listing:
https://doi.org/10.1109/TNS.2010.2046333