Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy

Abstract

Activator impurities and their distribution in the host lattice play a key role in scintillation phenomena. Here a combination of cross-sectional noncontact atomic force microscopy, x-ray photoelectron spectroscopy, and density-functional theory were used to study the distribution of Eu2+ dopants in a NaI scintillator activated by 3% EuI2. A variety of Eu-based structures were identified in crystals subjected to different postgrowth treatments. Transparent crystals with good scintillation properties contained mainly small precipitates with a cubic crystal structure and a size below 4 nm. Upon annealing, Eu segregated toward the surface, resulting in the formation of an ordered hexagonal overlayer with a EuI2 composition and a pronounced, unidirectional moiré pattern. Crystals with poor optical transparency showed a significant degree of mosaicity and the presence of precipitates. All investigated crystals contained a very low concentration of Eu dopants present as isolated point defects; most of the europium was incorporated in larger structures.