September 2007

Conference Paper

EELS Valence Mapping in Electron Beam Sensitive FeFx/C Nanocomposites

By:
Cosandey, F.; Al-Sharab, J.F.; Amatucci, Glenn; Bentley, James
Journal Name:
Microscopy and Microanalysis
Page Number:
1262-1263
Volume:
13
Issue Number:
suppl 2
Publication Date:
September 19, 2007
Conference Name:
Microscopy and Microanalysis 2007
Conference Location:
Fort Lauderdale, Florida, United States of America
Conference Sponsor:
Microscopy Society of America, Microbeam Analysis Society, International Metallographic Society