Effects of annealing on fission fragment release from electrodeposited Cf-252 thin-films

Abstract

Samarium thin-films doped with a Cf-252 radiotracer were used to study the effects of annealing on the release of fission fragments from electrodeposited films. An ammonium acetate molecular plating technique was utilized to perform the depositions. The fission fragment yields were measured using a unique technique involving the exposure of aluminum foils to the deposited material for a fixed time followed by gamma-ray spectroscopy to determine the rate at which the fission fragments implanted into the foils. Annealing of the electrodeposited films was found to have no effect on the release of fission fragments.