Emittance Characterization of a Hot-Cavity Laser Ion Source at HRIBF

Abstract

The first investigation of the transverse emittance of a hot-cavity laser ion source based on all-solid-state Ti:Sapphire lasers is presented. The emittances of 63Cu ion beams generated by three-photon resonant ionization are measured and compared with that of the 69Ga and 39K ion beams resulting from surface ionization in the same ion source. A Self-Consistent, Unbiased Elliptical Exclusion (SCUBEEx) method is adapted for noise reduction and emittance analysis. Typical values of the rms and 90% fractional emittances of the Cu ion beams at 20 keV energy are found to be about 2 ��-mm-mrad and 8 ��-mm-mrad, respectively, for the ion currents of 2 to 40 nA investigated. The emittances of the laser-produced Cu ion beams are smaller than those of the surface-ionized Ga and K ion beams.