November 2012

Conference Paper

Emittance studies of the SNS external-antenna H- ion source

By:
Han, Baoxi ; Stockli, Martin P; Welton, Robert F; Pennisi, Terry R; Murray Jr, Sydney N; Santana, Manuel ; Long, Cary D
Journal Name:
Review of Scientific Instruments
Volume:
81
Issue Number:
2
Publication Date:
November 20, 2012
Conference Name:
the 13th International Conference on Ion Sources
Conference Location:
Gatlinburg, Tennessee, United States of America
View DOI Listing:
https://doi.org/10.1063/1.3292935

Abstract

A new Allison-type emittance scanner has been built to characterize the ion sources and low energy beam transport systems at SNS. In this work, the emittance characteristics of the H- beam produced with the external-antenna RF-driven ion source and transported through the 2-lens electrostatic LEBT are studied. The beam emittance dependence on beam intensity, extraction parameters, and the evolution of the emittance and twiss parameters over beam pulse duration are presented.