May 2013

Journal

Exploring flatland: AFM of mechanical and electrical properties of graphene, MoS2 and other low-dimensional materials

By:
Bertolazzi, Simone; Brivio, Jacopo; Radenovic, Aleksandra; Kis, Andras; Wilson, Heather; Prisbrey, Landon; Minot, Ethan; Tselev, Alexander ; Philips, Mick; Viani, Mario; Walters, Deron; Proksch, Roger
Journal Name:
Microscopy and Analysis
Page Number:
21
Volume:
27
Issue Number:
3
Publication Date:
May 2, 2013