November 2023

Conference Paper

Following the Electrons: Simulation for High-Resolution STEM and CBED

By:
Oxley, Mark P
Journal Name:
Microscopy and Microanalysis
Page Number:
2680-2681
Volume:
25
Issue Number:
S2
Publication Date:
November 9, 2023
Conference Name:
Microscopy and Microanalysis 2019
Conference Location:
Portland, Oregon, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1017/S1431927619014132