August 2011

Book Chapter

From 3D Imaging of Atoms to Macroscopic Device Properties

By:
Pennycook, Stephen J; Chisholm, Matthew F; Van Benthem, Klaus ; Marinopulos, Apostolos; Pantelides, Sokrates T
Page Number:
259-281
Book Title:
Defects in Microelectronic Materials and Devices
Publication Date:
August 5, 2011
Publisher Location:
CRC Press, Boca Raton, Federated States of Micronesia, United States of America