November 2023

Conference Paper

Imaging Conductivity in a Single Atomic Layer

By:
Dyck, Ondrej E; Swett, Jacob; Lupini, Andrew R; Jesse, Stephen
Journal Name:
Microscopy and Microanalysis
Page Number:
1704-1705
Volume:
26
Issue Number:
S2
Publication Date:
November 9, 2023
Conference Name:
Microscopy and Microanalysis
Conference Location:
Milwaukee, Wisconsin, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1017/S1431927620019030