March 2010

Journal

IN-SITU NEUTRON DIFFRACTION MEASUREMENT OF TRANSIENT TEMPERATURE AND STRESS FIELDS IN A THIN PLATE

By:
Woo, Wan Chuck ; Feng, Zhili ; Wang, Xun-Li ; An, Ke ; Hubbard, Camden R; David, Stan ; Choo, Hahn
Journal Name:
Applied Physics Letters
Page Number:
261903
Volume:
88
Issue Number:
26
Publication Date:
March 23, 2010

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