January 2013

Journal

Inelastic neutron scattering study of phonon density of states in nanostructured Si1−xGex thermoelectrics

By:
Dhital, Chetan; Abernathy, Douglas L; Zhu, Gaohua; Ren, Zhifeng; Broido, D.; Wilson, Stephen D
Journal Name:
Physical Review B
Page Number:
214303-214303
Volume:
86
Issue Number:
21
Publication Date:
January 17, 2013
View DOI Listing:
https://doi.org/10.1103/PhysRevB.86.214303

Abstract

Inelastic neutron scattering measurements are utilized to explore relative changes in the generalized phonon density of states of nanocrystalline Si1−xGex thermoelectric materials prepared via ball-milling and hot-pressing techniques. Dynamic signatures of Ge clustering can be inferred from the data by referencing the resulting spectra to a density functional theoretical model assuming homogeneous alloying via the virtual-crystal approximation. Comparisons are also presented between as-milled Si nanopowder and bulk, polycrystalline Si where a preferential low-energy enhancement and lifetime broadening of the phonon density of states appear in the nanopowder. Negligible differences are however observed between the phonon spectra of bulk Si andhot-pressed, nanostructured Si samples suggesting that changes to the single-phonon dynamics above 4 meV play only a secondary role in the modified heat conduction of this compound.


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