September 2013

Journal

Influence of RF-sputtering power on formation of vertically stacked Si1-xGex nanocrystals formation ultra-thin amorphous Al2O3 layers: structural and photoluminescence properties

By:
Vieira, E.; Martin-Sanchez, J.; Roldan Gutierrez, Manuel A; Varela Del Arco, Maria ; Buljan, M.; Bernstorff, S.; Barradas, N.; Franco, N; Correia, R.; Rolo, A.; Pennycook, Stephen J; Molina, S. I.; Alves, E.; Chahboun, A.; Gomes, M.J.M.
Journal Name:
Journal of Physics D: Applied Physics
Volume:
46
Issue Number:
1
Publication Date:
September 20, 2013