November 2023

Conference Paper

Interpreting Voids in Atom Probe Tomography Data via Experiment and Theory

By:
Poplawsky, Jonathan D; Wang, Xing ; Hatzouglou, Constantinos; Guo, Wei ; Jin, Ke ; Bei, Hongbin; Wang, Yongqiang; Weber, William J; Zhang, Yanwen ; Vurpillot, Francois; More, Karren L
Journal Name:
Microscopy and Microanalysis
Page Number:
290-291
Volume:
25
Issue Number:
S2
Publication Date:
November 9, 2023
Conference Name:
Microscopy and Microanalysis 2019
Conference Location:
Portland, Oregon, United States of America
Conference Sponsor:
MSA, MAS, and ifes
View DOI Listing:
https://doi.org/10.1017/S1431927619002186

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