August 2011

Journal

Investigating the Optical Properties of Dislocations by Scanning Transmission Electron Microscopy

By:
Pennycook, Stephen J
Journal Name:
Scanning
Page Number:
287-298
Volume:
30
Issue Number:
4
Publication Date:
August 10, 2011
View DOI Listing:
https://doi.org/10.1002/sca.20114

Abstract

The scanning transmission electron microscope (STEM) allows collection of a number of simultaneous signals, such as cathodoluminescence, transmitted electron intensity and spectroscopic information from individual localized defects. This review traces the development of cathodoluminescence and atomic resolution imaging from their early inception through to the possibilities that exist today for achieving a true atomic-scale understanding of the optical properties of individual dislocations cores. This review is dedicated to Professor David Holt, a pioneer in this field.