July 2009

Journal

Local, submicron, strain gradients as the cause of Sn whisker growth

By:
Sobiech, M.; Wohlschlogel, M.; Welzel, U.; Mittemeijer, E.; Hugel, W.; Seekamp, A.; Liu, W.; Ice, Gene E
Journal Name:
Applied Physics Letters
Page Number:
221901-221901
Volume:
94
Issue Number:
22
Publication Date:
July 1, 2009
View DOI Listing:
https://doi.org/10.1063/1.3147864