November 2005

Journal

Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope

By:
Varela Del Arco, Maria ; Lupini, Andrew R; Van Benthem, Klaus ; Borisevich, Albina Y; Chisholm, Matthew F; Shibata, Naoya; Abe, E.; Pennycook, Stephen J
Journal Name:
Annual Review of Materials Research
Page Number:
539-569
Volume:
35
Issue Number:
n/a
Publication Date:
November 22, 2005