September 2017

Conference Paper

Online condition monitoring of SiC devices using intelligent gate drive for converter performance improvement

By:
Tolbert, Leon M; Dyer, Jacob H; Wang, Fei ; Costinett, Daniel J; Blalock, Benjamin J; Zhang, Zheyu
Page Number:
182-187
Book Title:
IEEE Workshop on Wide Bandgap Power Devices and Applications
Publication Date:
September 16, 2017
Conference Name:
IEEE Workshop on Wide Bandgap Power Devices and Applications
Conference Location:
Fayetteville, Arkansas, United States of America
Conference Sponsor:
IEEE
View DOI Listing:
https://doi.org/10.1109/WiPDA.2016.7799934