November 2008

Journal

Polychromatic X-ray Micro- and Nanodiffraction for Spatially-Resolved Structural Studies

By:
Budai, John D; Liu, W.; Tischler, Jonathan Z; Pan, Zhengwei; Norton, David; Larson, Bennett C; Yang, Wenge; Ice, Gene E
Journal Name:
Thin Solid Films
Page Number:
8013-8021
Volume:
516
Issue Number:
22
Publication Date:
November 25, 2008
View DOI Listing:
https://doi.org/10.1016/j.tsf.2008.04.045