November 2012

Conference Paper

Resistivity, carrier trapping, and polarization phenomenon in semiconductor radiation detection materials

By:
Biswas, Koushik ; Du, Maohua ; Singh, David J
Journal Name:
Proceedings of SPIE
Page Number:
85070
Volume:
8507
Issue Number:
N/A
Publication Date:
November 14, 2012
Conference Name:
SPIE 2012 Oprics+Photonics
Conference Location:
San Diego, California, United States of America
View DOI Listing:
https://doi.org/10.1117/12.930072