October 2006

Journal

Resonance Enhancement in Piezoresponse Force Microscopy: Maping Electromechanical Activity, Contact Stiffness, and Q-Factor

By:
Jesse, Stephen ; Mirman, B; Kalinin, Sergei V
Journal Name:
Applied Physics Letters
Page Number:
22906
Volume:
89
Issue Number:
2
Publication Date:
October 12, 2006

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