October 2008

Journal

Strain-induced Polarization Rotation in Epitaxial (001) BiFeO3 Thin Films

By:
Jang, J; Baek, S; Ortiz, D; Das, R; Folkman, C; Chu, Y; Shafer, Paul; Zhang, J; S, Choudhury; Vaithyanathan, V; Chen, Y; Felker, D; Biegalski, Michael D; Rzchowski, M; Pan, X; Chen, L. Q.; Schlom, D.; Ramesh, R.; Eom, Chang-Beom
Journal Name:
Physical Review Letters
Page Number:
107602
Volume:
101
Issue Number:
10
Publication Date:
October 7, 2008
View DOI Listing:
https://doi.org/10.1103/PhysRevLett.101.107602

Abstract

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain-dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.