July 2006

Conference Paper

Tomographic Imaging of Nanocrystals by Aberration-Corrected Scanning Transmission Electron Microscopy

By:
Van Benthem, Klaus ; Peng, Yiping ; Pennycook, Stephen J
Page Number:
3-7
Volume:
839
Book Title:
Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure
Publication Date:
July 28, 2006
Conference Name:
2004 MRS Fall Meeting
Conference Location:
Boston, Massachusetts, United States of America
Conference Sponsor:
Materials Research Society