Truncated nonlinear interferometric characterization of optical beam displacement

INVENTION REFERENCE NUMBER

201804238

  • Detectors and Sensors
  • Quantum Information Technologies

The truncated nonlinear interferometric readout for scanning probe microscopes that is disclosed here provides quantum noise reduction below the standard quantum limit and signal amplification for optically transduced microcantilever beam displacement measurements.


Inventors

Benjamin J. Lawrie Computational Sciences & Engineering Division


Contact

To learn more about this technology, email [email protected] or call 865-574-1051.